31456979

9781249059783

Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.

Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.

Out of Stock

The item you're looking for is currently unavailable.

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9781249059783
  • ISBN: 124905978X
  • Publication Date: 2012
  • Publisher: ProQuest, UMI Dissertation Publishing

AUTHOR

David J Ellison

SUMMARY

David J Ellison is the author of 'Visualizing Structure / Property Relationships in Organic Semiconductor Thin Films by Scanning Probe Microscopy.', published 2012 under ISBN 9781249059783 and ISBN 124905978X.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.