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9781461360049

Testability Concepts for Digital ICs : The Macro Test Approach

Testability Concepts for Digital ICs : The Macro Test Approach
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Product details

  • ISBN-13: 9781461360049
  • ISBN: 1461360048
  • Publication Date: 2013
  • Publisher: Springer

AUTHOR

Beenker, F. P. M., Bennetts, R. G., Thijssen, A. P.

SUMMARY

Beenker, F. P. M. is the author of 'Testability Concepts for Digital ICs : The Macro Test Approach', published 2013 under ISBN 9781461360049 and ISBN 1461360048.

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