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9789812778819

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
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  • ISBN-13: 9789812778819
  • ISBN: 9812778810
  • Publication Date: 2007
  • Publisher: World Scientific Publishing Company, Incorporated

AUTHOR

Nakamura, Takashi

SUMMARY

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.Nakamura, Takashi is the author of 'Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices', published 2007 under ISBN 9789812778819 and ISBN 9812778810.

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