Secondary Ion Mass Spectrometry: SIMS VII - A. Benninghoven - Hardcover

Partial table of contents:FUNDAMENTALS.Origin of Secondary Ions Emitted from Liquids (P. Todd).QUANTITATION.Relative Sensitivity Factors for Gallium Primary Ion Beam (H. Satoh, et al.).COMPLEMENTARY TECHNIQUES.Trace Oxygen Analysis by Glow Discharge Mass Spectrometry (J. Huneke, et al.).ORGANIC AND BIOLOGICAL ANALYSES.Time-of-Flight SIMS Analysis of Polymers and Polymer Surfaces (J. Lub & H. van der Wel).GEOLOGICAL APPLICATIONS.Isotope Abundances of Silicates Produced in Gas-Condensation Furnace (C. Uyeda, et al.).DEPTH PROFILING AND SEMICONDUCTOR APPLICATIONS.Evidence of a New Beam-Induced Effect in Depth Profile Analysis of Thin Films of Amorphous Silicon (J. Herion, et al.).HIGH TEMPERATURE SUPERCONDUCTOR APPLICATIONS.Quantitative SIMS of Superconducting Oxide Systems (E. Engström, et al.).METALLURGICAL APPLICATIONS.Metallurgical Applications of SIMS Analysis on Steels (D. Loison).STATIC SIMS AND THE ANALYSIS OF POLYMERS.Static SIMS Investigations of Organic-Metallic Surface Reactions (B. Wenclawiak & T. Prater).INSTRUMENTATION.The IMS 1270--A New High Transmission SIMS (C. Conty, et al.).ION IMAGING.Recent Developments of the IMS 4F Imaging Capabilities (M. Schuhmacher, et al.).List of Contributors.Index.of Reviewers.Index of Session Chairpersons.Benninghoven, A. is the author of 'Secondary Ion Mass Spectrometry: SIMS VII - A. Benninghoven - Hardcover' with ISBN 9780471927389 and ISBN 0471927384.