Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)

Secondary Ion Mass Spectrometry is a major contribution to the incipient literature on SIMS, and the most thorough presentation yet of this analytical technique. Three of the field's leading researchers join together to give a detailed and rigorous presentation of the entire subject, discussing fundamentals, instrumentation, and applications. Secondary Ion Mass Spectrometry is suitable as both an introduction and an advanced handbook. The beginner will find a rapid survey on basic concepts of SIMS, on its application, and on the many publications treating the subject. The expert will find, for the first time, a comprehensive and systematic treatment of the many details and topics of SIMS. Features include: presentation of sputter theory and ion optics as self-contained units an up-to-date presentation of ion generation a systematic and detailed description of the often bewildering variety of artifacts in depth profiling tables and nomograms together with values of general physical constants and often-used mathematical functions Secondary Ion Mass Spectrometry is a state-of-the-art book, thorough-going and complete. Analytical chemists will find it an invaluable reference and handbook.A. Benninghoven is the author of 'Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)', published 1987 under ISBN 9780471010562 and ISBN 0471010561.