Scanning Tunneling Mictroscopy/Spectroscopy and Related Techniques 12th International Conference, Stm'03

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level.Koenraad, Paul M. is the author of 'Scanning Tunneling Mictroscopy/Spectroscopy and Related Techniques 12th International Conference, Stm'03', published 2003 under ISBN 9780735401686 and ISBN 0735401683.