Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)

Interaction of Metal Films on Semiconductors (S. D. Mukherjee). Mechanisms and Interfacial Layers in Silicide Formation (G. Ottaviani and J. W. Mayer). Interdiffusion of Metal Films on Gallium Arsenide and Indium Phosphide (D. V. Morgan). Reliability and Degradation of Silicon Devices and Integrated Circuits (J. Wood). Reliability and Degradation of Active III-V Semiconductor Devices (J. E. Davey and A. Christou). Reliability and Degradation of Lasers and Leds (D. H. Newman and S. Ritchie). Reliability and Degradation of Microwave Integrated Circuits (A. G. Van Nie, W. Goodblood, and G. Kersuzan). Index.Howes, M. J. is the author of 'Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)', published 1981 under ISBN 9780471280286 and ISBN 0471280283.