New Characterization Techniques for Thin Polymer Films

Various industries and universities have aimed their activities toward the development of highly sensitive techniques capable of studying ultrathin polymer films. Provides researchers with a working description of the principles of operation, areas of application and data analysis methods for some of the newly developed techniques, as well as sufficient references for future in-depth studies of thin polymer films. The techniques covered are divided into two groups--bulk property measurements and surface/interface property measurements--with chapters covering microdielectrometry, stress measurement by x-ray diffraction, laser interferometry, ion beam analysis, photothermal analysis, and XPS/SIMS/AES, among other techniques. Abstracts for each of the chapters are conveniently located in the preface.Tong, Ho-Ming is the author of 'New Characterization Techniques for Thin Polymer Films' with ISBN 9780471623465 and ISBN 0471623466.