Mtdt 2005: 2005 IEEE International Workshop on Memory Technology, Design and Testing (03-05 August 2005/Taipei, Taiwan)

Over the past decade, memory has expanded a great deal, as embedded components in almost every integrated circuit, or as add-on memory sticks in almost every consumer electronics devices. Indeed, there has been a proliferation and globalization of memory technology. Yet, the relentless trend for smaller device, less power-consumption, and higher speed continues. At the same time, with the ever-increasing dominance of memory components in an IC, memory testing and yield ramp up problems pose greater challenges than ever before in mass production. MTDT 2005 includes 25 technical papers covering all aspects of the enabling technologies of a memory product from device, design, testing, reliability, and yield analysis to mass production. In addition, two papers shed light on "advanced simulation technology for memory" and explore a new emerging type of memory called "zero-capacitor DRAM" for System-on-Chip applications. Since the first MTDT in 1993, the semiconductor memory industry has gone through several ups and downs, with Moore's Law still being observed. MTDT has faithfully recorded the technical frontier and corners during this period of the history.IEEE Computer Society Staff is the author of 'Mtdt 2005: 2005 IEEE International Workshop on Memory Technology, Design and Testing (03-05 August 2005/Taipei, Taiwan)', published 2005 under ISBN 9780769523132 and ISBN 0769523137.