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9780735404410

Frontiers of Characterization and Metrology for Nanoelectronics

Frontiers of Characterization and Metrology for Nanoelectronics
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Your due date: 9/25/2024

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  • Condition: Good
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  • Ships From: Philadelphia, PA
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  • Comments: Ship within 24hrs. Satisfaction 100% guaranteed. APO/FPO addresses supported
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Product details

  • ISBN-13: 9780735404410
  • ISBN: 0735404410
  • Publication Date: 2007
  • Publisher: American Institute of Physics

AUTHOR

Seiler, David G., Diebold, Alain C., McDonald, Robert

SUMMARY

Seiler, David G. is the author of 'Frontiers of Characterization and Metrology for Nanoelectronics', published 2007 under ISBN 9780735404410 and ISBN 0735404410.

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