Electrical and Thermal Characterization of Mesfets, Hemts, and Hbts

Encompassing three important technologies, this book explains why III-V transistor device electrical characteristics change with temperature, and develops models of the temperature change for use in integrated circuit design programs. You'll find a wealth of experimental S-equivalent-circuit parameter data on a wide variety of devices that has never before been presented, as well as learn how to measure S-parameters and fit equivalent circuits. Includes 200 equations and 181 illustrations.Anholt, Robert R. H. is the author of 'Electrical and Thermal Characterization of Mesfets, Hemts, and Hbts' with ISBN 9780890067499 and ISBN 089006749X.