Elastic and Inelastic Scattering in Electron Diffraction and Imaging

This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes principles, techniques, and applications in his discussions of thermal diffusely scattered, valence-loss, and atomic inner-shell scattered electrons in compositional sensitive imaging.Lin Wang, Zhong is the author of 'Elastic and Inelastic Scattering in Electron Diffraction and Imaging' with ISBN 9780306449291 and ISBN 0306449293.