68698448
9781585373420
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EOS ESD Association is the author of 'ANSI/ESD SP5.4.1-2022 ESD Association Standard Practice for Latch-Up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits - Transient Latch-up Testing - Device Level', published 2022 under ISBN 9781585373420 and ISBN 1585373427.
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