20674409
9780819459268
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.Assoufid, Lahsen is the author of 'Advances in Metrology for X-ray and Euv Optics (Proceedings of Spie)', published 2005 under ISBN 9780819459268 and ISBN 0819459267.
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