241249

9780780337374

1997 2nd International Workshop on Statistical Metrology

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  • ISBN-13: 9780780337374
  • ISBN: 0780337379
  • Publisher: IEEE

AUTHOR

IEEE, Electron Devices Society Staff, IEEE, Inc. Staff

SUMMARY

IEEE, Electron Devices Society Staff is the author of '1997 2nd International Workshop on Statistical Metrology' with ISBN 9780780337374 and ISBN 0780337379.

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